Design for AT-Speed Test, Diagnosis and Measurement is  the first book to offer practical and proven design-for-testability  (DFT) solutions to chip and system design engineers, test engineers  and product managers at the silicon level as well as at the board and  systems levels. Designers will see how the implementation of embedded  test enables simplification of silicon debug and system bring-up. Test  engineers will determine how embedded test provides a superior level  of at-speed test, diagnosis and measurement without exceeding the  capabilities of their equipment. Product managers will learn how the  time, resources and costs associated with test development,  manufacture cost and lifecycle maintenance of their products can be  significantly reduced by designing embedded test in the product. A  complete design flow and analysis of the impact of embedded test on a  design makes this book a `must read' before any DFT is attempted.

Design for AT-Speed Test, Diagnosis and Measurement (FRONTIERS IN ELECTRONIC TESTING Volume 15) PDF

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