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Pattern Recognition: 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings PDF

590 Pages

2010

22.322 MB

English

by David Gallup, Marc Pollefeys, Jan-Michael Frahm (auth.), Michael Goesele, Stefan Roth, Arjan Kuijper, Bernt Schiele, Konrad Schindler (eds.)

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