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X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 PDF

pages464 Pages
release year1988
file size17.324 MB
languageEnglish
by D. Sayre, M. Howells, J. Kirz, H. Rarback (auth.), David Sayre Ph. D., Professor Janos Kirz Ph. D., Malcolm Howells Ph. D., Harvey Rarback Ph. D. (eds.)
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